K. Ulutas Et Al. , "Thickness dependence of the dielectric properties of thermally evaporated Sb2Te3 thin films," 15th International Conference on Thin Films (ICTF) , vol.417, Kyoto, Japan, 2011
Ulutas, K. Et Al. 2011. Thickness dependence of the dielectric properties of thermally evaporated Sb2Te3 thin films. 15th International Conference on Thin Films (ICTF) , (Kyoto, Japan).
Ulutas, K., Deger, D., & Yakut, S. E., (2011). Thickness dependence of the dielectric properties of thermally evaporated Sb2Te3 thin films . 15th International Conference on Thin Films (ICTF), Kyoto, Japan
Ulutas, Hulusi, Deniz ULUTAŞ, And Şahin YAKUT. "Thickness dependence of the dielectric properties of thermally evaporated Sb2Te3 thin films," 15th International Conference on Thin Films (ICTF), Kyoto, Japan, 2011
Ulutas, Hulusi K. Et Al. "Thickness dependence of the dielectric properties of thermally evaporated Sb2Te3 thin films." 15th International Conference on Thin Films (ICTF) , Kyoto, Japan, 2011
Ulutas, K. Deger, D. And Yakut, S. E. (2011) . "Thickness dependence of the dielectric properties of thermally evaporated Sb2Te3 thin films." 15th International Conference on Thin Films (ICTF) , Kyoto, Japan.
@conferencepaper{conferencepaper, author={Hulusi Kemal ULUTAŞ Et Al. }, title={Thickness dependence of the dielectric properties of thermally evaporated Sb2Te3 thin films}, congress name={15th International Conference on Thin Films (ICTF)}, city={Kyoto}, country={Japan}, year={2011}}