Cicek, Z. Et Al. 2023. Thickness dependence of dielectric properties of TlGaS2 thin films. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING , vol.166 .

Cicek, Z., YAKUT, S., DEGER, D., Bozoglu, D., Mustafaeva, S., Ismailova, P., ... Hasanov, A.(2023). Thickness dependence of dielectric properties of TlGaS2 thin films. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING , vol.166.

Cicek, Z. Et Al. "Thickness dependence of dielectric properties of TlGaS2 thin films," MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING , vol.166, 2023

Cicek, Z. Et Al. "Thickness dependence of dielectric properties of TlGaS2 thin films." MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING , vol.166, 2023

Cicek, Z. Et Al. (2023) . "Thickness dependence of dielectric properties of TlGaS2 thin films." MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING , vol.166.

@article{article, author={Z. Cicek Et Al. }, title={Thickness dependence of dielectric properties of TlGaS2 thin films}, journal={MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING}, year=2023}