Değer, D. And Ulutaş, H. K. 2001. The thickness dependence of dielectric properties of amorphous Al2O3 films. International Conference of Atomic Collision Solids , (Paris, France), 150.

Değer, D., & Ulutaş, H. K., (2001). The thickness dependence of dielectric properties of amorphous Al2O3 films . International Conference of Atomic Collision Solids (pp.150). Paris, France

Değer, Deniz, And Hulusi Kemal ULUTAŞ. "The thickness dependence of dielectric properties of amorphous Al2O3 films," International Conference of Atomic Collision Solids, Paris, France, 2001

Değer, Deniz And Ulutaş, Hulusi K. . "The thickness dependence of dielectric properties of amorphous Al2O3 films." International Conference of Atomic Collision Solids , Paris, France, pp.150, 2001

Değer, D. And Ulutaş, H. K. (2001) . "The thickness dependence of dielectric properties of amorphous Al2O3 films." International Conference of Atomic Collision Solids , Paris, France, p.150.

@conferencepaper{conferencepaper, author={Deniz ULUTAŞ And author={Hulusi Kemal ULUTAŞ}, title={The thickness dependence of dielectric properties of amorphous Al2O3 films}, congress name={International Conference of Atomic Collision Solids}, city={Paris}, country={France}, year={2001}, pages={150} }