M. ÇALIŞKAN Et Al. , "Characterization of Cu/PAr/CdS MIS structure for sensor applications," OPTOELECTRONICS AND ADVANCED MATERIALS-RAPID COMMUNICATIONS , vol.8, pp.603-607, 2014
ÇALIŞKAN, M. Et Al. 2014. Characterization of Cu/PAr/CdS MIS structure for sensor applications. OPTOELECTRONICS AND ADVANCED MATERIALS-RAPID COMMUNICATIONS , vol.8 , 603-607.
ÇALIŞKAN, M., Kuruoglu, F., & SERİN, M., (2014). Characterization of Cu/PAr/CdS MIS structure for sensor applications. OPTOELECTRONICS AND ADVANCED MATERIALS-RAPID COMMUNICATIONS , vol.8, 603-607.
ÇALIŞKAN, Murat, Furkan KURUOĞLU, And Merih SERİN. "Characterization of Cu/PAr/CdS MIS structure for sensor applications," OPTOELECTRONICS AND ADVANCED MATERIALS-RAPID COMMUNICATIONS , vol.8, 603-607, 2014
ÇALIŞKAN, Murat Et Al. "Characterization of Cu/PAr/CdS MIS structure for sensor applications." OPTOELECTRONICS AND ADVANCED MATERIALS-RAPID COMMUNICATIONS , vol.8, pp.603-607, 2014
ÇALIŞKAN, M. Kuruoglu, F. And SERİN, M. (2014) . "Characterization of Cu/PAr/CdS MIS structure for sensor applications." OPTOELECTRONICS AND ADVANCED MATERIALS-RAPID COMMUNICATIONS , vol.8, pp.603-607.
@article{article, author={Murat ÇALIŞKAN Et Al. }, title={Characterization of Cu/PAr/CdS MIS structure for sensor applications}, journal={OPTOELECTRONICS AND ADVANCED MATERIALS-RAPID COMMUNICATIONS}, year=2014, pages={603-607} }