H. O. Öztel Et Al. , "Deep-level transient spectroscopy analysis of interface defects in Ce:ZnO/p-Si heterostructures," Journal of Materials Science: Materials in Electronics , vol.35, no.18, 2024
Öztel, H. O. Et Al. 2024. Deep-level transient spectroscopy analysis of interface defects in Ce:ZnO/p-Si heterostructures. Journal of Materials Science: Materials in Electronics , vol.35, no.18 .
Öztel, H. O., AKÇAY, N., & ALGÜN, G., (2024). Deep-level transient spectroscopy analysis of interface defects in Ce:ZnO/p-Si heterostructures. Journal of Materials Science: Materials in Electronics , vol.35, no.18.
Öztel, Halim, Namık AKÇAY, And Gökhan ALGÜN. "Deep-level transient spectroscopy analysis of interface defects in Ce:ZnO/p-Si heterostructures," Journal of Materials Science: Materials in Electronics , vol.35, no.18, 2024
Öztel, Halim O. Et Al. "Deep-level transient spectroscopy analysis of interface defects in Ce:ZnO/p-Si heterostructures." Journal of Materials Science: Materials in Electronics , vol.35, no.18, 2024
Öztel, H. O. AKÇAY, N. And ALGÜN, G. (2024) . "Deep-level transient spectroscopy analysis of interface defects in Ce:ZnO/p-Si heterostructures." Journal of Materials Science: Materials in Electronics , vol.35, no.18.
@article{article, author={Halim Onur Öztel Et Al. }, title={Deep-level transient spectroscopy analysis of interface defects in Ce:ZnO/p-Si heterostructures}, journal={Journal of Materials Science: Materials in Electronics}, year=2024}