H. G. Sezgin-Ugranli And Y. ÖZÇELEP, "Determination of Power MOSFET's Gate Oxide Degradation Under Different Electrical Stress Levels Based on Stress-Induced Oxide Capacitance Changes," IEEE TRANSACTIONS ON ELECTRON DEVICES , vol.68, no.2, pp.688-696, 2021
Sezgin-Ugranli, H. G. And ÖZÇELEP, Y. 2021. Determination of Power MOSFET's Gate Oxide Degradation Under Different Electrical Stress Levels Based on Stress-Induced Oxide Capacitance Changes. IEEE TRANSACTIONS ON ELECTRON DEVICES , vol.68, no.2 , 688-696.
Sezgin-Ugranli, H. G., & ÖZÇELEP, Y., (2021). Determination of Power MOSFET's Gate Oxide Degradation Under Different Electrical Stress Levels Based on Stress-Induced Oxide Capacitance Changes. IEEE TRANSACTIONS ON ELECTRON DEVICES , vol.68, no.2, 688-696.
Sezgin-Ugranli, Hatice, And Yasin ÖZÇELEP. "Determination of Power MOSFET's Gate Oxide Degradation Under Different Electrical Stress Levels Based on Stress-Induced Oxide Capacitance Changes," IEEE TRANSACTIONS ON ELECTRON DEVICES , vol.68, no.2, 688-696, 2021
Sezgin-Ugranli, Hatice G. And ÖZÇELEP, Yasin. "Determination of Power MOSFET's Gate Oxide Degradation Under Different Electrical Stress Levels Based on Stress-Induced Oxide Capacitance Changes." IEEE TRANSACTIONS ON ELECTRON DEVICES , vol.68, no.2, pp.688-696, 2021
Sezgin-Ugranli, H. G. And ÖZÇELEP, Y. (2021) . "Determination of Power MOSFET's Gate Oxide Degradation Under Different Electrical Stress Levels Based on Stress-Induced Oxide Capacitance Changes." IEEE TRANSACTIONS ON ELECTRON DEVICES , vol.68, no.2, pp.688-696.
@article{article, author={Hatice Gul Sezgin-Ugranli And author={Yasin ÖZÇELEP}, title={Determination of Power MOSFET's Gate Oxide Degradation Under Different Electrical Stress Levels Based on Stress-Induced Oxide Capacitance Changes}, journal={IEEE TRANSACTIONS ON ELECTRON DEVICES}, year=2021, pages={688-696} }