T. Nowozin Et Al. , "Temperature and electric field dependence of the carrier emission processes in a quantum dot-based memory structure, Appl. Phys. Lett," APPLIED PHYSICS LETTERS , vol.94, 2009
Nowozin, T. Et Al. 2009. Temperature and electric field dependence of the carrier emission processes in a quantum dot-based memory structure, Appl. Phys. Lett. APPLIED PHYSICS LETTERS , vol.94 .
Nowozin, T., Marent, A., Geller, M., Bimberg, D., AKÇAY, N., & ÖNCAN, N., (2009). Temperature and electric field dependence of the carrier emission processes in a quantum dot-based memory structure, Appl. Phys. Lett. APPLIED PHYSICS LETTERS , vol.94.
Nowozin, T. Et Al. "Temperature and electric field dependence of the carrier emission processes in a quantum dot-based memory structure, Appl. Phys. Lett," APPLIED PHYSICS LETTERS , vol.94, 2009
Nowozin, T. Et Al. "Temperature and electric field dependence of the carrier emission processes in a quantum dot-based memory structure, Appl. Phys. Lett." APPLIED PHYSICS LETTERS , vol.94, 2009
Nowozin, T. Et Al. (2009) . "Temperature and electric field dependence of the carrier emission processes in a quantum dot-based memory structure, Appl. Phys. Lett." APPLIED PHYSICS LETTERS , vol.94.
@article{article, author={T. Nowozin Et Al. }, title={Temperature and electric field dependence of the carrier emission processes in a quantum dot-based memory structure, Appl. Phys. Lett}, journal={APPLIED PHYSICS LETTERS}, year=2009}