Pehlivanli, D. Et Al. 2019. Detection of fraud risks in retailing sector using MLP and SVM techniques. TURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES , vol.27 , 3633-3647.

Pehlivanli, D., Eken, S., & Ayan, E., (2019). Detection of fraud risks in retailing sector using MLP and SVM techniques. TURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES , vol.27, 3633-3647.

Pehlivanli, Davut, Süleyman Eken, And Ebubekir Ayan. "Detection of fraud risks in retailing sector using MLP and SVM techniques," TURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES , vol.27, 3633-3647, 2019

Pehlivanli, Davut Et Al. "Detection of fraud risks in retailing sector using MLP and SVM techniques." TURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES , vol.27, pp.3633-3647, 2019

Pehlivanli, D. Eken, S. And Ayan, E. (2019) . "Detection of fraud risks in retailing sector using MLP and SVM techniques." TURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES , vol.27, pp.3633-3647.

@article{article, author={Davut PEHLİVANLI Et Al. }, title={Detection of fraud risks in retailing sector using MLP and SVM techniques}, journal={TURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES}, year=2019, pages={3633-3647} }