F. KAÇAR Et Al. , "Statıstıcal Model of Hot-Carrier Degradation and Lifetime Prediction for P-MOS Transistors," TURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES , vol.14, pp.2-37, 2006
KAÇAR, F. Et Al. 2006. Statıstıcal Model of Hot-Carrier Degradation and Lifetime Prediction for P-MOS Transistors. TURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES , vol.14 , 2-37.
KAÇAR, F., KUNTMAN, A., & Kuntman, H., (2006). Statıstıcal Model of Hot-Carrier Degradation and Lifetime Prediction for P-MOS Transistors. TURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES , vol.14, 2-37.
KAÇAR, Fırat, Ayten KUNTMAN, And Hakan Kuntman. "Statıstıcal Model of Hot-Carrier Degradation and Lifetime Prediction for P-MOS Transistors," TURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES , vol.14, 2-37, 2006
KAÇAR, Fırat Et Al. "Statıstıcal Model of Hot-Carrier Degradation and Lifetime Prediction for P-MOS Transistors." TURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES , vol.14, pp.2-37, 2006
KAÇAR, F. KUNTMAN, A. And Kuntman, H. (2006) . "Statıstıcal Model of Hot-Carrier Degradation and Lifetime Prediction for P-MOS Transistors." TURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES , vol.14, pp.2-37.
@article{article, author={Fırat KAÇAR Et Al. }, title={Statıstıcal Model of Hot-Carrier Degradation and Lifetime Prediction for P-MOS Transistors}, journal={TURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES}, year=2006, pages={2-37} }