H. G. Sezgin And Y. Ozcelep, "Characterization and modeling of power MOSFET switching times variations under constant electrical stress," MICROELECTRONICS RELIABILITY , vol.55, pp.492-497, 2015
Sezgin, H. G. And Ozcelep, Y. 2015. Characterization and modeling of power MOSFET switching times variations under constant electrical stress. MICROELECTRONICS RELIABILITY , vol.55 , 492-497.
Sezgin, H. G., & Ozcelep, Y., (2015). Characterization and modeling of power MOSFET switching times variations under constant electrical stress. MICROELECTRONICS RELIABILITY , vol.55, 492-497.
Sezgin, Hatice, And Yasin ÖZÇELEP. "Characterization and modeling of power MOSFET switching times variations under constant electrical stress," MICROELECTRONICS RELIABILITY , vol.55, 492-497, 2015
Sezgin, Hatice G. And Ozcelep, Yasin. "Characterization and modeling of power MOSFET switching times variations under constant electrical stress." MICROELECTRONICS RELIABILITY , vol.55, pp.492-497, 2015
Sezgin, H. G. And Ozcelep, Y. (2015) . "Characterization and modeling of power MOSFET switching times variations under constant electrical stress." MICROELECTRONICS RELIABILITY , vol.55, pp.492-497.
@article{article, author={Hatice Gui Sezgin And author={Yasin ÖZÇELEP}, title={Characterization and modeling of power MOSFET switching times variations under constant electrical stress}, journal={MICROELECTRONICS RELIABILITY}, year=2015, pages={492-497} }