Parto, M. Et Al. 2010. Thickness dependence of the dielectric properties of TlSbS2 thin films. Fizika Azerbaijan Journal of Physics , vol.16 , 339-341.

Parto, M., Değer , D., & Ulutaş, H. K., (2010). Thickness dependence of the dielectric properties of TlSbS2 thin films. Fizika Azerbaijan Journal of Physics , vol.16, 339-341.

Parto, Murat, Deniz ULUTAŞ, And Hulusi Kemal ULUTAŞ. "Thickness dependence of the dielectric properties of TlSbS2 thin films," Fizika Azerbaijan Journal of Physics , vol.16, 339-341, 2010

Parto, Murat Et Al. "Thickness dependence of the dielectric properties of TlSbS2 thin films." Fizika Azerbaijan Journal of Physics , vol.16, pp.339-341, 2010

Parto, M. Değer , D. And Ulutaş, H. K. (2010) . "Thickness dependence of the dielectric properties of TlSbS2 thin films." Fizika Azerbaijan Journal of Physics , vol.16, pp.339-341.

@article{article, author={Murat Parto Et Al. }, title={Thickness dependence of the dielectric properties of TlSbS2 thin films}, journal={Fizika Azerbaijan Journal of Physics}, year=2010, pages={339-341} }