B. Kınacı Et Al. , "Evaluation of dielectric properties of Au/TZO/n–Si structure depending on frequency and voltage," Journal of Materials Science: Materials in Electronics , vol.33, pp.10516-10523, 2022
Kınacı, B. Et Al. 2022. Evaluation of dielectric properties of Au/TZO/n–Si structure depending on frequency and voltage. Journal of Materials Science: Materials in Electronics , vol.33 , 10516-10523.
Kınacı, B., Bairam, C., Yalçın, Y., Çokduygulular, E., Çetinkaya, Ç., Efkere, H. İ., ... Özçelik, S.(2022). Evaluation of dielectric properties of Au/TZO/n–Si structure depending on frequency and voltage. Journal of Materials Science: Materials in Electronics , vol.33, 10516-10523.
Kınacı, Barış Et Al. "Evaluation of dielectric properties of Au/TZO/n–Si structure depending on frequency and voltage," Journal of Materials Science: Materials in Electronics , vol.33, 10516-10523, 2022
Kınacı, Barış Et Al. "Evaluation of dielectric properties of Au/TZO/n–Si structure depending on frequency and voltage." Journal of Materials Science: Materials in Electronics , vol.33, pp.10516-10523, 2022
Kınacı, B. Et Al. (2022) . "Evaluation of dielectric properties of Au/TZO/n–Si structure depending on frequency and voltage." Journal of Materials Science: Materials in Electronics , vol.33, pp.10516-10523.
@article{article, author={Barış Kınacı Et Al. }, title={Evaluation of dielectric properties of Au/TZO/n–Si structure depending on frequency and voltage}, journal={Journal of Materials Science: Materials in Electronics}, year=2022, pages={10516-10523} }