T. Nowozin Et Al. , "Temperature and electric field dependence of the carrier emission processes in a quantum dot-based memory structure," APPLIED PHYSICS LETTERS , vol.94, no.4, 2009
Nowozin, T. Et Al. 2009. Temperature and electric field dependence of the carrier emission processes in a quantum dot-based memory structure. APPLIED PHYSICS LETTERS , vol.94, no.4 .
Nowozin, T., Marent, A., GELLER, M., BİMBERG, D., Akcay, N., & Oencan, N., (2009). Temperature and electric field dependence of the carrier emission processes in a quantum dot-based memory structure. APPLIED PHYSICS LETTERS , vol.94, no.4.
Nowozin, Tobias Et Al. "Temperature and electric field dependence of the carrier emission processes in a quantum dot-based memory structure," APPLIED PHYSICS LETTERS , vol.94, no.4, 2009
Nowozin, Tobias Et Al. "Temperature and electric field dependence of the carrier emission processes in a quantum dot-based memory structure." APPLIED PHYSICS LETTERS , vol.94, no.4, 2009
Nowozin, T. Et Al. (2009) . "Temperature and electric field dependence of the carrier emission processes in a quantum dot-based memory structure." APPLIED PHYSICS LETTERS , vol.94, no.4.
@article{article, author={Tobias Nowozin Et Al. }, title={Temperature and electric field dependence of the carrier emission processes in a quantum dot-based memory structure}, journal={APPLIED PHYSICS LETTERS}, year=2009}