Research Information System
Thesis Type: Postgraduate
Institution Of The Thesis: Istanbul University, Faculty Of Science, Department Of Physics, Turkey
Approval Date: 2019
Thesis Language: Turkish
Student: Onur Potok
Supervisor: Hulusi Kemal Ulutaş
Abstract:
In
this study, polyethylene oxide (PEO) thin films having three different
molecular weights were obtained by thermal evaporation method. Sample
thicknesses were determined as 20, 100, 250 and 500 nm for each molecular
weight. Capacity (C) and loss factor (tanδ) measurements of the samples were
carried out by dielectric spectroscopy at room temperature and frequency range
of 1 Hz - 20 MHz. Dielectric constant, dielectric loss and alternative
conductivity values were calculated by using the obtained results. Thickness,
frequency and molecular weight behavior of dielectric properties of these
samples were investigated and possible polarization mechanisms in the structure
were determined