Thickness dependence of dielectric loss in anodic Al2O3 thin films

Ulutaş H. K., Değer D.

28th International Physics Congress, Muğla, Turkey, 1 - 04 September 2011, pp.635

  • Publication Type: Conference Paper / Full Text
  • City: Muğla
  • Country: Turkey
  • Page Numbers: pp.635
  • Istanbul University Affiliated: Yes