Impact Of Substrate And Post-Annealing Temperatures On The Refractive Index And Crystallinity Of Lead-Free BCTZ Thin Films
2D Ferroelectrics and Their Perspectives for Neural Networks, Antibes, Fransa, 16 - 18 Eylül 2024, ss.1, (Özet Bildiri)
- Yayın Türü: Bildiri / Özet Bildiri
- Basıldığı Şehir: Antibes
- Basıldığı Ülke: Fransa
- Sayfa Sayıları: ss.1
- Açık Arşiv Koleksiyonu: AVESİS Açık Erişim Koleksiyonu
- İstanbul Üniversitesi Adresli: Evet
Özet
In this study, we investigated the effects of substrate temperature and post-annealing treatment (P.A.T.) on the refractive index of lead-free Ba₀.₈₅Ca₀.₁₅Ti₀.₉Zr₀.₁O₃ (BCTZ) thin films synthesized by magnetron RF sputtering. Our results indicate that both the in-situ substrate temperature and the post-annealing treatment temperature influence the crystallinity of the films. Crystallinity was characterized using X-ray diffraction (XRD), while the refractive index was measured using the prism coupling method. Additionally, we utilized Atomic Force Microscopy (AFM) and cross-sectional Scanning Electron Microscopy (SEM) to analyze the film's roughness and in-plane morphology, respectively. We found that the refractive index of the films increased from 1.957 to 2.380, directly proportional to both the in-situ substrate temperature and the post-annealing temperature. However, significant porosity developed in the room-temperature-growth (R.T.G.) films which are subsequently subjected to post-annealing treatment at various temperatures. These findings highlight the critical role of temperature control in optimizing the optical properties and structural integrity of BCTZ thin films.