In-Situ XRD Measurements and Simulations to Determine Grain Sizes in GeSbTe at Various Annealing Temperatures

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ÇİL K., Woods Z., ADNANE L., CYWAR A., DIRISAGLIK F., ZHU Y., ...More

Materials Research Society (MRS) 2015 Fall Meeting, Boston, United States Of America, 29 November - 04 December 2015, vol.KK, no.321, pp.321, (Full Text)

• Publication Type: Conference Paper / Full Text
• Volume: KK
• City: Boston
• Country: United States Of America
• Page Numbers: pp.321
• Istanbul University Affiliated: No