In-Situ XRD Measurements and Simulations to Determine Grain Sizes in GeSbTe at Various Annealing Temperatures


ÇİL K. , Woods Z., ADNANE L., CYWAR A., DIRISAGLIK F., ZHU Y., ...More

Materials Research Society (MRS) 2015 Fall Meeting, Boston, United States Of America, 29 November - 04 December 2015, vol.KK, no.321, pp.321

  • Publication Type: Conference Paper / Full Text
  • Volume: KK
  • City: Boston
  • Country: United States Of America
  • Page Numbers: pp.321