THE OPTICAL-PROPERTIES OF THIN ERBIUM FILMS

ONCAN N., WARD L., PLAYER M.

OPTICS AND LASER TECHNOLOGY, cilt.26, sa.5, ss.361-364, 1994 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 26 Sayı: 5
  • Basım Tarihi: 1994
  • Doi Numarası: 10.1016/0030-3992(94)90124-4
  • Dergi Adı: OPTICS AND LASER TECHNOLOGY
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.361-364
  • İstanbul Üniversitesi Adresli: Hayır

Özet

The effective dielectric constant, epsilon2', of very thin films of erbium on sodium chloride substrates was determined from measurements of normal incidence reflectance and transmittance in the visible spectrum. Epsilon2' showed a maximum which moved to longer wavelengths as the film thickness increased. Electron microscopy revealed that the film islands grew flatter and more irregular with thickness. The shape factor of the islands, F, was calculated by a modified Maxwell-Garnett method and became smaller as the film thickness increased.