THE OPTICAL-PROPERTIES OF THIN ERBIUM FILMS


ONCAN N., WARD L., PLAYER M.

OPTICS AND LASER TECHNOLOGY, vol.26, no.5, pp.361-364, 1994 (SCI-Expanded) identifier identifier

  • Publication Type: Article / Article
  • Volume: 26 Issue: 5
  • Publication Date: 1994
  • Doi Number: 10.1016/0030-3992(94)90124-4
  • Journal Name: OPTICS AND LASER TECHNOLOGY
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.361-364
  • Istanbul University Affiliated: No

Abstract

The effective dielectric constant, epsilon2', of very thin films of erbium on sodium chloride substrates was determined from measurements of normal incidence reflectance and transmittance in the visible spectrum. Epsilon2' showed a maximum which moved to longer wavelengths as the film thickness increased. Electron microscopy revealed that the film islands grew flatter and more irregular with thickness. The shape factor of the islands, F, was calculated by a modified Maxwell-Garnett method and became smaller as the film thickness increased.