Temperature Dependence of Electrical Resistivity of Highly Doped Nanocrystalline and Amorphous Silicon Thin Films
Materials Research Society (MRS) 2010 Fall Meeting, Boston, United States Of America, 29 November - 03 December 2010, vol.AA, no.1765, pp.1765, (Full Text)
- Publication Type: Conference Paper / Full Text
- Volume: AA
- City: Boston
- Country: United States Of America
- Page Numbers: pp.1765
- Istanbul University Affiliated: No