Dynamic current activity measurement for integrated circuit emission model


Basak M. E. , Kuntman A.

8th International Conference on Electrical and Electronics Engineering (ELECO), Bursa, Turkey, 28 - 30 November 2013, pp.385-389 identifier identifier

  • Publication Type: Conference Paper / Full Text
  • Volume:
  • City: Bursa
  • Country: Turkey
  • Page Numbers: pp.385-389

Abstract

This paper describes the current activity measurement and modeling of integrated circuits for electromagnetic conducted emission. In this study, a test circuit including the MC9S12XMAG-family microcontroller was designed and measurements were made to confirm the applied measurement techniques. Moreover, internal current was obtained from the measured external current which is described as a dynamic current activity on the die. The input impedance measurements were performed in the frequency range from 1MHz to 2GHz. The passive distribution network was extracted with the differential evolution algorithm from the measured impedance - frequency curve and results were compared with the measurements. The external current was measured by the spectrum analyzer has been used to obtain the internal current of the die. Extracted passive distribution network and internal activity component values have been given to obtain the integrated circuit emission model.