Statıstıcal Model of Hot-Carrier Degradation and Lifetime Prediction for P-MOS Transistors


KAÇAR F. , KUNTMAN A. , Kuntman H.

TURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES, vol.14, pp.2-37, 2006 (Journal Indexed in SCI Expanded)

  • Publication Type: Article / Article
  • Volume: 14
  • Publication Date: 2006
  • Title of Journal : TURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES
  • Page Numbers: pp.2-37