Akademik Veri Yönetim Sistemi
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, cilt.34, sa.25, 2023 (SCI-Expanded)
Alumina (Al2O3) film with thicknesses of 100 nm were deposited on n-Si substrate at room temperature by radio frequency (RF) magnetron sputtering, and Al2O3/n-Si structure was rapidly thermally annealed at 400 & DEG;C under vacuum conditions. Within the scope of this study, elemental analysis and post-metallization electrical/dielectric analyzes of this structure were carried out as a function of vacuum annealing. Quantitative elemental microanalysis of the Al2O3/n-Si structure annealed at temperature of 400 & DEG;C was performed by scanning electron microscopy with energy dispersive spectroscopy (SEM-EDS) method. Through SEM-EDS analysis, the structure exhibited a pattern with an Al/O atomic ratio of approximately 2/3. The electrical properties of the Au/n-Si structure with Al2O3 interface layer annealed at temperature of 400 & DEG;C depending on the frequency (between 30 kHz and 1 MHz) and the voltage (& PLUSMN; 4 V) using C-V and G/?-V characteristics were obtained. In addition, the dielectric parameters such as dielectric constant, dielectric loss, loss tangent, and the electrical ac conductivity obtained by using the C and G/? data and the dielectric properties of Au/Al2O3/n-Si structure were analysis depending on the frequency and voltage, as in the electrical analysis.