Dielectric Spectroscopy of Ag Doped TlGaS2
Turkish Physical Society 40th International Physics Congress, Muğla, Türkiye, 2 - 06 Eylül 2024, ss.337, (Özet Bildiri)
- Yayın Türü: Bildiri / Özet Bildiri
- Basıldığı Şehir: Muğla
- Basıldığı Ülke: Türkiye
- Sayfa Sayıları: ss.337
- İstanbul Üniversitesi Adresli: Evet
Özet
Dielectric spectroscopy is a non-destructive analysis method which provide detailed
insights about materials’ electrical properties across a broad frequency range.
Dielectric behaviours of various substances such as polymers, ceramics or biological
tissues can be characterized by this method. Researchers can get information about
the material’s characteristic properties like molecular dynamics, polarization
mechanisms and conductivity by dielectric spectroscopy. The growing technology
demand on various fields has further amplified the relevance of dielectric
spectroscopy. TlGaS2 is a known ternary chalcogenide with it’s functional
optoelectronic and dielectric properties in the literature. Using Ag as a dopant is a
promising operation for enhancing dielectric properties and increasing the
applicability of the substance. This study has been done to see the impact of doping
Ag to TlGaS2 chalcogenide and evaluate it’s usage potential for technological
devices such as sensors, photo-detectors and nonlinear optical devices.