Dielectric Spectroscopy of Ag Doped TlGaS2


Abdulaziz R., Eminoğlu H. F., Ulutaş H. K., Yakut Ş., Bozoğlu Parto D., İsmailova P., ...Daha Fazla

Turkish Physical Society 40th International Physics Congress, Muğla, Türkiye, 2 - 06 Eylül 2024, ss.337, (Özet Bildiri)

  • Yayın Türü: Bildiri / Özet Bildiri
  • Basıldığı Şehir: Muğla
  • Basıldığı Ülke: Türkiye
  • Sayfa Sayıları: ss.337
  • İstanbul Üniversitesi Adresli: Evet

Özet

Dielectric spectroscopy is a non-destructive analysis method which provide detailed

insights about materials’ electrical properties across a broad frequency range.

Dielectric behaviours of various substances such as polymers, ceramics or biological

tissues can be characterized by this method. Researchers can get information about

the material’s characteristic properties like molecular dynamics, polarization

mechanisms and conductivity by dielectric spectroscopy. The growing technology

demand on various fields has further amplified the relevance of dielectric

spectroscopy. TlGaS2 is a known ternary chalcogenide with it’s functional

optoelectronic and dielectric properties in the literature. Using Ag as a dopant is a

promising operation for enhancing dielectric properties and increasing the

applicability of the substance. This study has been done to see the impact of doping

Ag to TlGaS2 chalcogenide and evaluate it’s usage potential for technological

devices such as sensors, photo-detectors and nonlinear optical devices.