Van Der Pauw Hall Mobility Measurement Setup for Thin Film Characterization at High Temperatures


ADNANE L., DIRISAGLIK F., ÇİL K. , GOKIRMAK A., SILVA H.

Connecticut Symposium on Microelectronics & Optoelectronics (CMOC), Bridgeport, United States Of America, 01 April 2015, pp.73

  • Publication Type: Conference Paper / Full Text
  • City: Bridgeport
  • Country: United States Of America
  • Page Numbers: pp.73