Statistical Investigation Of Symmetrical CMOS OTA Degradation

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ÖZÇELEP Y., KUNTMAN A., KUNTMAN H.

Istanbul University Journal of Electrical Electronics Engineering (IU-JEEE), vol.8, no.1, pp.549-555, 2008 (Peer-Reviewed Journal)

• Publication Type: Article / Article
• Volume: 8 Issue: 1
• Publication Date: 2008
• Journal Name: Istanbul University Journal of Electrical Electronics Engineering (IU-JEEE)
• Page Numbers: pp.549-555
• Istanbul University Affiliated: Yes