Relaxation spectrum of the TlSbSe2 thin films

Deger D. , Ulutas K. , Yildirim S. , Kalkan N.

PHYSICA B-CONDENSED MATTER, cilt.404, ss.5231-5233, 2009 (SCI İndekslerine Giren Dergi) identifier identifier

  • Cilt numarası: 404
  • Basım Tarihi: 2009
  • Doi Numarası: 10.1016/j.physb.2009.08.311
  • Sayfa Sayıları: ss.5231-5233


The dielectric constant and the dielectric loss of TlSbSe2 thin films, obtained via thermal evaporation of TlSbSe2 crystals grown by Stockber-Bridgman technique, have been measured using ohmic Al electrodes in the frequency range 0.2-100 KHz and within the temperature interval 293-353 K. The capacitance are found to decrease with increasing frequency and increase with increasing temperature. The activation energy values were evaluated too. A good agreement between the activation energy values obtained from capacitance and dielectric loss factor measurements has been observed. (C) 2009 Elsevier B.V. All rights reserved.