Thickness dependence of the dielectric properties of TlSbS2 thin films

Parto M., Değer D., Ulutaş H. K.

Fizika Azerbaijan Journal of Physics, vol.16, pp.339-341, 2010 (Peer-Reviewed Journal)

  • Publication Type: Article / Article
  • Volume: 16
  • Publication Date: 2010
  • Journal Name: Fizika Azerbaijan Journal of Physics
  • Page Numbers: pp.339-341
  • Istanbul University Affiliated: Yes